X-ray standing wave microscopy permits chemical microanalysis with atomic resolution
نویسندگان
چکیده
منابع مشابه
Scanning standing-wave illumination microscopy: a path to nanometer resolution in X-ray microscopy
X-ray microscopy can potentially combine the advantages of light microscopy with resolution approaching that of electron microscopy. In theory, x-ray microscopes can image unsectioned hydrated cells with nanometer resolution. In practice, however, the resolution of x-ray microscopes is limited to approximately 20 nm due to difficulties in the construction of high numerical-aperture (NA) x-ray f...
متن کاملAtomic Resolution X-ray Standing Wave Microstructural Characterization of NLO-Active Self-Assembled Chromophoric Superlattices
This contribution reports the first X-ray standing wave structural characterization of self-assembled NLOactive chromophoric multilayers (SAMs). These siloxane-based self-assembled stilbazolium multilayers are intrinsically acentric and exhibit very large second-order nonlinear optical responses. The locations of bromide ions within the SAMs were precisely determined using X-ray standing waves ...
متن کاملScattering: X-Ray Standing Wave Techniques
Introduction The X-ray standing wave (XSW) technique provides an element-specific structural probe by using x-ray reflectivity to generate a " two-beam " interference field that in turn induces a spatial dependence to the x-ray spectroscopic yields from atoms within the field. The XSW technique is primarily used for resolving the atomic-scale structure at surfaces, interfaces, and thin films wi...
متن کاملTheoretical Study of the Spatial Resolution of X-ray Microanalysis in Analytical Electron Microscopy
The spatial resolution of X-ray microanalysis has been investigated by Monte Carlo calculatio~s, including knock-on secondary electron production. The results for AuMa in a lOOOA thin Au film at 100 keV showed an appreciable difference from the ones without knock-out events. Also calculations have been done with the Mott cross-section instead of the screened Rutherford cross-section for elastic...
متن کاملCalibration of High-Resolution X-Ray Tomography With Atomic Force Microscopy
For two-dimensional x-ray imaging of thin films, the technique of scanning transmission x-ray microscopy (STXM) has achieved images with feature sizes as small as 40 nm in recent years. However, calibration of three-dimensional tomographic images that are produced with STXM data at this scale has not yet been described in the scientific literature, and the calibration procedure has novel proble...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2002
ISSN: 0108-7673
DOI: 10.1107/s0108767302087810